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Single-Event Upsets for Single-Port and Two-Port SRAM Cells..:

Pieper, N. J. ; Xiong, Y. ; Pasternak, J....
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1673-1679 , 2023
Link: https://doi.org/10.1109/tns.2023.3240979