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Proton-Induced Displacement Damages in 2-D and Stacked CMOS..:
Jouni, Ali
;
Sicre, Mathieu
;
Malherbe, Victor
...
IEEE Transactions on Nuclear Science. 70 (2023) 4 - p. 515-522 , 2023
Link:
https://doi.org/10.1109/tns.2023.3248521
RT Journal T1
Proton-Induced Displacement Damages in 2-D and Stacked CMOS SPADs: Study of Dark Count Rate Degradation
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2023.3248521&Exemplar=1&LAN=DE A1 Jouni, Ali A1 Sicre, Mathieu A1 Malherbe, Victor A1 Mamdy, Bastien A1 Thery, Thomas A1 Belloir, Jean-Marc A1 Soussan, Dimitri A1 De Paoli, Serge A1 Lorquet, Vincent A1 Lalucaa, Valérian A1 Virmontois, Cédric A1 Gasiot, Gilles A1 Goiffon, Vincent PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 70 IS 4 SP 515 OP 522 LK http://dx.doi.org/https://doi.org/10.1109/tns.2023.3248521 DO https://doi.org/10.1109/tns.2023.3248521 SF ELIB - SuUB Bremen
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