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1 Ergebnisse
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Assessment of Radiation-Induced Soft Errors on Lightweight ..:
Gava, Jonas
;
Moura, Nicolas
;
Lucena, Joaquim
...
IEEE Transactions on Nuclear Science. 70 (2023) 8 - p. 1805-1813 , 2023
Link:
https://doi.org/10.1109/tns.2023.3253684
RT Journal T1
Assessment of Radiation-Induced Soft Errors on Lightweight Cryptography Algorithms Running on a Resource-Constrained Device
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2023.3253684&Exemplar=1&LAN=DE A1 Gava, Jonas A1 Moura, Nicolas A1 Lucena, Joaquim A1 Rocha, Vinìcius da A1 Garibotti, Rafael A1 Calazans, Ney A1 Cuenca-Asensi, Sergio A1 Bastos, Rodrigo Possamai A1 Reis, Ricardo A1 Ost, Luciano PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 70 IS 8 SP 1805 OP 1813 LK http://dx.doi.org/https://doi.org/10.1109/tns.2023.3253684 DO https://doi.org/10.1109/tns.2023.3253684 SF ELIB - SuUB Bremen
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