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1 Ergebnisse
1
Radiation-Induced Degradation Mechanism of X-Ray SOI Pixel ..:
Hagino, Kouichi
;
Kitajima, Masatoshi
;
Kohmura, Takayoshi
...
IEEE Transactions on Nuclear Science. 70 (2023) 7 - p. 1444-1450 , 2023
Link:
https://doi.org/10.1109/tns.2023.3287130
RT Journal T1
Radiation-Induced Degradation Mechanism of X-Ray SOI Pixel Sensors With Pinned Depleted Diode Structure
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2023.3287130&Exemplar=1&LAN=DE A1 Hagino, Kouichi A1 Kitajima, Masatoshi A1 Kohmura, Takayoshi A1 Kurachi, Ikuo A1 Tsuru, Takeshi G. A1 Yukumoto, Masataka A1 Takeda, Ayaki A1 Mori, Koji A1 Nishioka, Yusuke A1 Tanaka, Takaaki PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 70 IS 7 SP 1444 OP 1450 LK http://dx.doi.org/https://doi.org/10.1109/tns.2023.3287130 DO https://doi.org/10.1109/tns.2023.3287130 SF ELIB - SuUB Bremen
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