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1 Ergebnisse
1
Ultra-Large Silicon Diode for Characterizing Low-Intensity ..:
Biłko, Kacper
;
Alía, Rubén García
;
Girard, Sylvain
...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 770-776 , 2024
Link:
https://doi.org/10.1109/tns.2023.3337839
RT Journal T1
Ultra-Large Silicon Diode for Characterizing Low-Intensity Radiation Environments
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2023.3337839&Exemplar=1&LAN=DE A1 Biłko, Kacper A1 Alía, Rubén García A1 Girard, Sylvain A1 Barbero, Mario Sacristan A1 Cecchetto, Matteo A1 Belanger-Champagne, Camille A1 Brucoli, Matteo A1 Danzeca, Salvatore A1 Hands, Alex A1 Holgado, Pedro Martín A1 Garcia, Yolanda Morilla A1 Maestre, Amor Romero A1 Sebban, Marc A1 Widorski, Markus PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 71 IS 4 SP 770 OP 776 LK http://dx.doi.org/https://doi.org/10.1109/tns.2023.3337839 DO https://doi.org/10.1109/tns.2023.3337839 SF ELIB - SuUB Bremen
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