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1 Ergebnisse
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Depth Dependence of Neutron-Induced Errors in 3-D NAND Floa..:
Gerardin, S.
;
Bagatin, M.
;
Paccagnella, A.
...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 508-514 , 2024
Link:
https://doi.org/10.1109/tns.2023.3345011
RT Journal T1
Depth Dependence of Neutron-Induced Errors in 3-D NAND Floating Gate Cells
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2023.3345011&Exemplar=1&LAN=DE A1 Gerardin, S. A1 Bagatin, M. A1 Paccagnella, A. A1 Beltrami, S. A1 Benvenuti, A. A1 Cazzaniga, C. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 71 IS 4 SP 508 OP 514 LK http://dx.doi.org/https://doi.org/10.1109/tns.2023.3345011 DO https://doi.org/10.1109/tns.2023.3345011 SF ELIB - SuUB Bremen
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