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1 Ergebnisse
1
Total Ionizing Dose Effects on a CDTI based CCD-on-CMOS thr..:
Salih Alj, Antoine
;
Touron, Pierre
;
Roy, François
...
IEEE Transactions on Nuclear Science. , 2024
Link:
https://doi.org/10.1109/tns.2024.3358381
RT Journal T1
Total Ionizing Dose Effects on a CDTI based CCD-on-CMOS through Buildup of Interface Traps and Oxide Charges
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2024.3358381&Exemplar=1&LAN=DE A1 Salih Alj, Antoine A1 Touron, Pierre A1 Roy, François A1 Demiguel, Stéphane A1 Michelot, Julien A1 Lalucaa, Valérian A1 Virmontois, Cédric A1 Magnan, Pierre A1 Goiffon, Vincent PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/tns.2024.3358381 DO https://doi.org/10.1109/tns.2024.3358381 SF ELIB - SuUB Bremen
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