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1 Ergebnisse
1
Radiation-Induced Effects in SiC Vertical Power MOSFETs Irr..:
Bonaldo, S.
;
Martinella, C.
;
Race, S.
...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 418-426 , 2024
Link:
https://doi.org/10.1109/tns.2024.3366190
RT Journal T1
Radiation-Induced Effects in SiC Vertical Power MOSFETs Irradiated at Ultrahigh Doses
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2024.3366190&Exemplar=1&LAN=DE A1 Bonaldo, S. A1 Martinella, C. A1 Race, S. A1 Für, N. A1 Mattiazzo, S. A1 Bagatin, M. A1 Gerardin, S. A1 Paccagnella, A. A1 Grossner, U. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 71 IS 4 SP 418 OP 426 LK http://dx.doi.org/https://doi.org/10.1109/tns.2024.3366190 DO https://doi.org/10.1109/tns.2024.3366190 SF ELIB - SuUB Bremen
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