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1 Ergebnisse
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Characterization of a 28 nm CMOS Technology for Analog Appl..:
Traversi, G.
;
Gaioni, L.
;
Ratti, L.
..
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 932-940 , 2024
Link:
https://doi.org/10.1109/tns.2024.3382348
RT Journal T1 <Title>Characterization of a 28 nm CMOS Technology for Analog Applications in High Energy Physics</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2024.3382348&Exemplar=1&LAN=DE A1 Traversi, G. A1 Gaioni, L. A1 Ratti, L. A1 Re, V. A1 Riceputi, E. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 71 IS 4 SP 932 OP 940 LK http://dx.doi.org/https://doi.org/10.1109/tns.2024.3382348 DO https://doi.org/10.1109/tns.2024.3382348 SF ELIB - SuUB Bremen
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