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Guest Editorial: Automated Machine Learning:
Escalante, Hugo Jair
;
Yao, Quanming
;
Tu, Wei-Wei
...
IEEE Transactions on Pattern Analysis and Machine Intelligence. 43 (2021) 9 - p. 2887-2890 , 2021
Link:
https://doi.org/10.1109/tpami.2021.3077106
RT Journal T1 <Title>Guest Editorial: Automated Machine Learning</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpami.2021.3077106&Exemplar=1&LAN=DE A1 Escalante, Hugo Jair A1 Yao, Quanming A1 Tu, Wei-Wei A1 Pillay, Nelishia A1 Qu, Rong A1 Yu, Yang A1 Houlsby, Neil PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 0162-8828 SN 2160-9292 SN 1939-3539 JF IEEE Transactions on Pattern Analysis and Machine Intelligence VO 43 IS 9 SP 2887 OP 2890 LK http://dx.doi.org/https://doi.org/10.1109/tpami.2021.3077106 DO https://doi.org/10.1109/tpami.2021.3077106 SF ELIB - SuUB Bremen
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