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Contrastive Bayesian Analysis for Deep Metric Learning:

Kan, Shichao ; He, Zhiquan ; Cen, Yigang...
IEEE Transactions on Pattern Analysis and Machine Intelligence.  45 (2023)  6 - p. 7220-7238 , 2023
Link: https://doi.org/10.1109/tpami.2022.3221486