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1 Ergebnisse
1
Deep Long-Tailed Learning: A Survey:
Zhang, Yifan
;
Kang, Bingyi
;
Hooi, Bryan
..
IEEE Transactions on Pattern Analysis and Machine Intelligence. 45 (2023) 9 - p. 10795-10816 , 2023
Link:
https://doi.org/10.1109/tpami.2023.3268118
RT Journal T1 <Title>Deep Long-Tailed Learning: A Survey</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpami.2023.3268118&Exemplar=1&LAN=DE A1 Zhang, Yifan A1 Kang, Bingyi A1 Hooi, Bryan A1 Yan, Shuicheng A1 Feng, Jiashi PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0162-8828 SN 2160-9292 SN 1939-3539 JF IEEE Transactions on Pattern Analysis and Machine Intelligence VO 45 IS 9 SP 10795 OP 10816 LK http://dx.doi.org/https://doi.org/10.1109/tpami.2023.3268118 DO https://doi.org/10.1109/tpami.2023.3268118 SF ELIB - SuUB Bremen
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