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1 Ergebnisse
1
Knockoffs-SPR: Clean Sample Selection in Learning With Nois..:
Wang, Yikai
;
Fu, Yanwei
;
Sun, Xinwei
IEEE Transactions on Pattern Analysis and Machine Intelligence. 46 (2024) 5 - p. 3242-3256 , 2024
Link:
https://doi.org/10.1109/tpami.2023.3338268
RT Journal T1
Knockoffs-SPR: Clean Sample Selection in Learning With Noisy Labels
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpami.2023.3338268&Exemplar=1&LAN=DE A1 Wang, Yikai A1 Fu, Yanwei A1 Sun, Xinwei PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0162-8828 SN 2160-9292 SN 1939-3539 JF IEEE Transactions on Pattern Analysis and Machine Intelligence VO 46 IS 5 SP 3242 OP 3256 LK http://dx.doi.org/https://doi.org/10.1109/tpami.2023.3338268 DO https://doi.org/10.1109/tpami.2023.3338268 SF ELIB - SuUB Bremen
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