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1 Ergebnisse
1
Breakthrough Short Circuit Robustness Demonstrated in Verti..:
Zhang, Ruizhe
;
Liu, Jingcun
;
Li, Qiang
...
IEEE Transactions on Power Electronics. 37 (2022) 6 - p. 6253-6258 , 2022
Link:
https://doi.org/10.1109/tpel.2021.3138451
RT Journal T1 <Title>Breakthrough Short Circuit Robustness Demonstrated in Vertical GaN Fin JFET</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpel.2021.3138451&Exemplar=1&LAN=DE A1 Zhang, Ruizhe A1 Liu, Jingcun A1 Li, Qiang A1 Pidaparthi, Subhash A1 Edwards, Andrew A1 Drowley, Cliff A1 Zhang, Yuhao PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0885-8993 SN 1941-0107 JF IEEE Transactions on Power Electronics VO 37 IS 6 SP 6253 OP 6258 LK http://dx.doi.org/https://doi.org/10.1109/tpel.2021.3138451 DO https://doi.org/10.1109/tpel.2021.3138451 SF ELIB - SuUB Bremen
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