I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Copper-Wire Stress Buffers for Extending Lifetime of Double..:
Liu, Siqi
;
Mei, Yun-Hui
;
Li, Jing
..
IEEE Transactions on Power Electronics. 38 (2023) 6 - p. 7118-7127 , 2023
Link:
https://doi.org/10.1109/tpel.2023.3252266
RT Journal T1 <Title>Copper-Wire Stress Buffers for Extending Lifetime of Double-Sided Bidirectional SiC Modules</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpel.2023.3252266&Exemplar=1&LAN=DE A1 Liu, Siqi A1 Mei, Yun-Hui A1 Li, Jing A1 Li, Xin A1 Lu, Guo-Quan PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0885-8993 SN 1941-0107 JF IEEE Transactions on Power Electronics VO 38 IS 6 SP 7118 OP 7127 LK http://dx.doi.org/https://doi.org/10.1109/tpel.2023.3252266 DO https://doi.org/10.1109/tpel.2023.3252266 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
