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1 Ergebnisse
1
Dynamic On-Resistance Characterization of GaN Power HEMTs U..:
Xie, Zonglun
;
Wu, Xinke
;
Dong, Zezheng
...
IEEE Transactions on Power Electronics. 39 (2024) 2 - p. 1963-1967 , 2024
Link:
https://doi.org/10.1109/tpel.2023.3331891
RT Journal T1 <Title>Dynamic On-Resistance Characterization of GaN Power HEMTs Under Forward/Reverse Conduction Using Multigroup Double Pulse Test</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpel.2023.3331891&Exemplar=1&LAN=DE A1 Xie, Zonglun A1 Wu, Xinke A1 Dong, Zezheng A1 Sun, Jiahui A1 Sheng, Kuang A1 Chen, Kevin J. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0885-8993 SN 1941-0107 JF IEEE Transactions on Power Electronics VO 39 IS 2 SP 1963 OP 1967 LK http://dx.doi.org/https://doi.org/10.1109/tpel.2023.3331891 DO https://doi.org/10.1109/tpel.2023.3331891 SF ELIB - SuUB Bremen
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