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1 Ergebnisse
1
Comparative Study on High-Temperature Electrical Properties..:
Gu, Zhaoyuan
;
Yang, Mingchao
;
Yang, Yi
...
IEEE Transactions on Power Electronics. 39 (2024) 4 - p. 4187-4201 , 2024
Link:
https://doi.org/10.1109/tpel.2023.3338487
RT Journal T1 <Title>Comparative Study on High-Temperature Electrical Properties of 1.2 kV SiC MOSFET and JBS-Integrated MOSFET</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpel.2023.3338487&Exemplar=1&LAN=DE A1 Gu, Zhaoyuan A1 Yang, Mingchao A1 Yang, Yi A1 Liu, Xihao A1 Gao, Mingyang A1 Qi, Jinwei A1 Liu, Weihua A1 Han, Chuanyu A1 Geng, Li A1 Hao, Yue PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0885-8993 SN 1941-0107 JF IEEE Transactions on Power Electronics VO 39 IS 4 SP 4187 OP 4201 LK http://dx.doi.org/https://doi.org/10.1109/tpel.2023.3338487 DO https://doi.org/10.1109/tpel.2023.3338487 SF ELIB - SuUB Bremen
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