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1 Ergebnisse
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Potential Failure Risk of Fault Location for Modular Multil..:
Zhang, Yaqian
;
Zhang, Yi
;
Zhang, Jianzhong
..
IEEE Transactions on Power Electronics. 39 (2024) 3 - p. 3601-3612 , 2024
Link:
https://doi.org/10.1109/tpel.2023.3344268
RT Journal T1 <Title>Potential Failure Risk of Fault Location for Modular Multilevel Converters Under Light Loads and a Current Reshaping-Based Solution</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpel.2023.3344268&Exemplar=1&LAN=DE A1 Zhang, Yaqian A1 Zhang, Yi A1 Zhang, Jianzhong A1 Deng, Fujin A1 Blaabjerg, Frede PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0885-8993 SN 1941-0107 JF IEEE Transactions on Power Electronics VO 39 IS 3 SP 3601 OP 3612 LK http://dx.doi.org/https://doi.org/10.1109/tpel.2023.3344268 DO https://doi.org/10.1109/tpel.2023.3344268 SF ELIB - SuUB Bremen
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