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1 Ergebnisse
1
Protecting SiC JFET From Gate Overstress in GaN/SiC Cascode..:
Shu, Ji
;
Sun, Jiahui
;
Zheng, Zheyang
.
IEEE Transactions on Power Electronics. 39 (2024) 5 - p. 5567-5575 , 2024
Link:
https://doi.org/10.1109/tpel.2024.3354833
RT Journal T1 <Title>Protecting SiC JFET From Gate Overstress in GaN/SiC Cascode Device Without Compromising Switching Performance</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpel.2024.3354833&Exemplar=1&LAN=DE A1 Shu, Ji A1 Sun, Jiahui A1 Zheng, Zheyang A1 Chen, Kevin J. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0885-8993 SN 1941-0107 JF IEEE Transactions on Power Electronics VO 39 IS 5 SP 5567 OP 5575 LK http://dx.doi.org/https://doi.org/10.1109/tpel.2024.3354833 DO https://doi.org/10.1109/tpel.2024.3354833 SF ELIB - SuUB Bremen
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