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1 Ergebnisse
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A Path Dependence Identification Method for Power MOSFETs D..:
Ye, Xuerong
;
Sun, Qisen
;
Zhang, Ruyue
...
IEEE Transactions on Power Electronics. 39 (2024) 10 - p. 12470-12477 , 2024
Link:
https://doi.org/10.1109/tpel.2024.3414838
RT Journal T1 <Title>A Path Dependence Identification Method for Power MOSFETs Degradation Due to Bias Temperature Instability</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpel.2024.3414838&Exemplar=1&LAN=DE A1 Ye, Xuerong A1 Sun, Qisen A1 Zhang, Ruyue A1 Hu, Yifan A1 Chen, Cen A1 Xie, Min A1 Zhai, Guofu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0885-8993 SN 1941-0107 JF IEEE Transactions on Power Electronics VO 39 IS 10 SP 12470 OP 12477 LK http://dx.doi.org/https://doi.org/10.1109/tpel.2024.3414838 DO https://doi.org/10.1109/tpel.2024.3414838 SF ELIB - SuUB Bremen
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