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1 Ergebnisse
1
A Gate Degradation Independent Online Junction Temperature ..:
Zhao, Zhigang
;
Wang, Peng
;
Chen, Tianyuan
IEEE Transactions on Power Electronics. 39 (2024) 10 - p. 13771-13782 , 2024
Link:
https://doi.org/10.1109/tpel.2024.3416182
RT Journal T1 <Title>A Gate Degradation Independent Online Junction Temperature Estimation Method for SiC MOSFETs Based on Residual Resistance</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tpel.2024.3416182&Exemplar=1&LAN=DE A1 Zhao, Zhigang A1 Wang, Peng A1 Chen, Tianyuan PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0885-8993 SN 1941-0107 JF IEEE Transactions on Power Electronics VO 39 IS 10 SP 13771 OP 13782 LK http://dx.doi.org/https://doi.org/10.1109/tpel.2024.3416182 DO https://doi.org/10.1109/tpel.2024.3416182 SF ELIB - SuUB Bremen
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