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1 Ergebnisse
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Investigations on Damage Effect of the Switching Diode Indu..:
Qi, Xu
;
Chai, Yuxuan
;
Song, Tao
...
IEEE Transactions on Plasma Science. , 2024
Link:
https://doi.org/10.1109/tps.2024.3418526
RT Journal T1
Investigations on Damage Effect of the Switching Diode Induced by a High-Power Terahertz Gyrotron
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tps.2024.3418526&Exemplar=1&LAN=DE A1 Qi, Xu A1 Chai, Yuxuan A1 Song, Tao A1 Zhang, Aoge A1 Mao, Taotao A1 Zhang, Chen A1 Ma, Jiatian A1 Liang, Peisheng A1 Zhu, Chenghui A1 Zhang, Kaichun A1 Wu, Zhenhua A1 Jiao, Jiao A1 Yao, Na A1 Hu, Min A1 Wei, Yanyu A1 Gong, Yubin A1 Wang, Wei A1 Liu, Diwei PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0093-3813 SN 1939-9375 JF IEEE Transactions on Plasma Science SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/tps.2024.3418526 DO https://doi.org/10.1109/tps.2024.3418526 SF ELIB - SuUB Bremen
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