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Degradation Modeling With Long-Term Memory Considering Meas..:
Shao, Yunfei
;
Si, Wujun
IEEE Transactions on Reliability. 72 (2023) 1 - p. 177-189 , 2023
Link:
https://doi.org/10.1109/tr.2021.3125958
RT Journal T1 <Title>Degradation Modeling With Long-Term Memory Considering Measurement Errors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tr.2021.3125958&Exemplar=1&LAN=DE A1 Shao, Yunfei A1 Si, Wujun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9529 SN 1558-1721 JF IEEE Transactions on Reliability VO 72 IS 1 SP 177 OP 189 LK http://dx.doi.org/https://doi.org/10.1109/tr.2021.3125958 DO https://doi.org/10.1109/tr.2021.3125958 SF ELIB - SuUB Bremen
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