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1 Ergebnisse
1
Reliability Analysis Based on a Bivariate Degradation Model..:
Zheng, Bokai
;
Chen, Cen
;
Lin, Yigang
..
IEEE Transactions on Reliability. 72 (2023) 1 - p. 37-48 , 2023
Link:
https://doi.org/10.1109/tr.2022.3172416
RT Journal T1
Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tr.2022.3172416&Exemplar=1&LAN=DE A1 Zheng, Bokai A1 Chen, Cen A1 Lin, Yigang A1 Ye, Xuerong A1 Zhai, Guofu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9529 SN 1558-1721 JF IEEE Transactions on Reliability VO 72 IS 1 SP 37 OP 48 LK http://dx.doi.org/https://doi.org/10.1109/tr.2022.3172416 DO https://doi.org/10.1109/tr.2022.3172416 SF ELIB - SuUB Bremen
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