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1 Ergebnisse
1
Reliability Engineering in a Time of Rapidly Converging Tec..:
Shieh, Shiuhpyng Winston
;
Voas, Jeff
;
Laplante, Phil
...
IEEE Transactions on Reliability. 73 (2024) 1 - p. 73-82 , 2024
Link:
https://doi.org/10.1109/tr.2024.3355905
RT Journal T1
Reliability Engineering in a Time of Rapidly Converging Technologies
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tr.2024.3355905&Exemplar=1&LAN=DE A1 Shieh, Shiuhpyng Winston A1 Voas, Jeff A1 Laplante, Phil A1 Rupe, Jason A1 Hansen, Christian A1 Wu, Yu-Sung A1 Chen, Yi-Ting A1 Li, Chi-Yu A1 Wu, Kai-Chiang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9529 SN 1558-1721 JF IEEE Transactions on Reliability VO 73 IS 1 SP 73 OP 82 LK http://dx.doi.org/https://doi.org/10.1109/tr.2024.3355905 DO https://doi.org/10.1109/tr.2024.3355905 SF ELIB - SuUB Bremen
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