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1 Ergebnisse
1
Better Data Labelling With EMBLEM (and how that Impacts Def..:
Tu, Huy
;
Yu, Zhe
;
Menzies, Tim
IEEE Transactions on Software Engineering. 48 (2022) 1 - p. 278-294 , 2022
Link:
https://doi.org/10.1109/tse.2020.2986415
RT Journal T1 <Title>Better Data Labelling With EMBLEM (and how that Impacts Defect Prediction)</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tse.2020.2986415&Exemplar=1&LAN=DE A1 Tu, Huy A1 Yu, Zhe A1 Menzies, Tim PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0098-5589 SN 1939-3520 SN 2326-3881 JF IEEE Transactions on Software Engineering VO 48 IS 1 SP 278 OP 294 LK http://dx.doi.org/https://doi.org/10.1109/tse.2020.2986415 DO https://doi.org/10.1109/tse.2020.2986415 SF ELIB - SuUB Bremen
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