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1 Ergebnisse
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Finding Critical Scenarios for Automated Driving Systems: A..:
Zhang, Xinhai
;
Tao, Jianbo
;
Tan, Kaige
...
IEEE Transactions on Software Engineering. 49 (2023) 3 - p. 991-1026 , 2023
Link:
https://doi.org/10.1109/tse.2022.3170122
RT Journal T1 <Title>Finding Critical Scenarios for Automated Driving Systems: A Systematic Mapping Study</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tse.2022.3170122&Exemplar=1&LAN=DE A1 Zhang, Xinhai A1 Tao, Jianbo A1 Tan, Kaige A1 Törngren, Martin A1 Sánchez, José Manuel Gaspar A1 Ramli, Muhammad Rusyadi A1 Tao, Xin A1 Gyllenhammar, Magnus A1 Wotawa, Franz A1 Mohan, Naveen A1 Nica, Mihai A1 Felbinger, Hermann PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0098-5589 SN 1939-3520 SN 2326-3881 JF IEEE Transactions on Software Engineering VO 49 IS 3 SP 991 OP 1026 LK http://dx.doi.org/https://doi.org/10.1109/tse.2022.3170122 DO https://doi.org/10.1109/tse.2022.3170122 SF ELIB - SuUB Bremen
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