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1 Ergebnisse
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A Data Transfer and Relevant Metrics Matching Based Approac..:
Bal, Pravas Ranjan
;
Kumar, Sandeep
IEEE Transactions on Software Engineering. 49 (2023) 3 - p. 1232-1245 , 2023
Link:
https://doi.org/10.1109/tse.2022.3173678
RT Journal T1 <Title>A Data Transfer and Relevant Metrics Matching Based Approach for Heterogeneous Defect Prediction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tse.2022.3173678&Exemplar=1&LAN=DE A1 Bal, Pravas Ranjan A1 Kumar, Sandeep PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0098-5589 SN 1939-3520 SN 2326-3881 JF IEEE Transactions on Software Engineering VO 49 IS 3 SP 1232 OP 1245 LK http://dx.doi.org/https://doi.org/10.1109/tse.2022.3173678 DO https://doi.org/10.1109/tse.2022.3173678 SF ELIB - SuUB Bremen
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