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1 Ergebnisse
1
Automatic Defect Classification Using Semi-Supervised Learn..:
Kim, Yusung
;
Lee, Jin-Seop
;
Lee, Jee-Hyong
IEEE Transactions on Semiconductor Manufacturing. 36 (2023) 3 - p. 476-485 , 2023
Link:
https://doi.org/10.1109/tsm.2023.3278036
RT Journal T1 <Title>Automatic Defect Classification Using Semi-Supervised Learning With Defect Localization</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tsm.2023.3278036&Exemplar=1&LAN=DE A1 Kim, Yusung A1 Lee, Jin-Seop A1 Lee, Jee-Hyong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0894-6507 SN 1558-2345 JF IEEE Transactions on Semiconductor Manufacturing VO 36 IS 3 SP 476 OP 485 LK http://dx.doi.org/https://doi.org/10.1109/tsm.2023.3278036 DO https://doi.org/10.1109/tsm.2023.3278036 SF ELIB - SuUB Bremen
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