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1 Ergebnisse
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Automated Visual Inspection of Defects in Transparent Displ..:
Jang, Hyeonjoong
;
Cho, Sanghoon
;
Jeon, Daniel S.
...
IEEE Transactions on Semiconductor Manufacturing. 36 (2023) 3 - p. 486-493 , 2023
Link:
https://doi.org/10.1109/tsm.2023.3280897
RT Journal T1 <Title>Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tsm.2023.3280897&Exemplar=1&LAN=DE A1 Jang, Hyeonjoong A1 Cho, Sanghoon A1 Jeon, Daniel S. A1 Kang, Dahyun A1 Song, Myeongho A1 Park, Changhyun A1 Kim, Jaewon A1 Kim, Min H. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0894-6507 SN 1558-2345 JF IEEE Transactions on Semiconductor Manufacturing VO 36 IS 3 SP 486 OP 493 LK http://dx.doi.org/https://doi.org/10.1109/tsm.2023.3280897 DO https://doi.org/10.1109/tsm.2023.3280897 SF ELIB - SuUB Bremen
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