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1 Ergebnisse
1
Small Fault Diagnosis With Gap Metric:
Jin, Hailang
;
Zuo, Zhiqiang
;
Wang, Yijing
...
IEEE Transactions on Systems, Man, and Cybernetics: Systems. 53 (2023) 9 - p. 5715-5728 , 2023
Link:
https://doi.org/10.1109/tsmc.2023.3276060
RT Journal T1
Small Fault Diagnosis With Gap Metric
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tsmc.2023.3276060&Exemplar=1&LAN=DE A1 Jin, Hailang A1 Zuo, Zhiqiang A1 Wang, Yijing A1 Cui, Lei A1 Zhao, Zhengen A1 Li, Linlin A1 Gao, Zhiwei PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2168-2216 SN 2168-2232 JF IEEE Transactions on Systems, Man, and Cybernetics: Systems VO 53 IS 9 SP 5715 OP 5728 LK http://dx.doi.org/https://doi.org/10.1109/tsmc.2023.3276060 DO https://doi.org/10.1109/tsmc.2023.3276060 SF ELIB - SuUB Bremen
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