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1 Ergebnisse
1
Adaptive Binning Coincidence Test for Uniformity Testing:
Salgia, Sudeep
;
Wang, Xinyi
;
Zhao, Qing
.
IEEE Transactions on Signal Processing. 72 (2024) - p. 2421-2435 , 2024
Link:
https://doi.org/10.1109/tsp.2024.3397560
RT Journal T1 <Title>Adaptive Binning Coincidence Test for Uniformity Testing</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tsp.2024.3397560&Exemplar=1&LAN=DE A1 Salgia, Sudeep A1 Wang, Xinyi A1 Zhao, Qing A1 Tong, Lang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1053-587X SN 1941-0476 JF IEEE Transactions on Signal Processing VO 72 SP 2421 OP 2435 LK http://dx.doi.org/https://doi.org/10.1109/tsp.2024.3397560 DO https://doi.org/10.1109/tsp.2024.3397560 SF ELIB - SuUB Bremen
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