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1 Ergebnisse
1
Test data compression and test time reduction using an embe..:
Sungbae Hwang
;
Abraham, J.A.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 11 (2003) 5 - p. 853-862 , 2003
Link:
https://doi.org/10.1109/tvlsi.2003.817140
RT Journal T1
Test data compression and test time reduction using an embedded microprocessor
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2003.817140&Exemplar=1&LAN=DE A1 Sungbae Hwang A1 Abraham, J.A. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2003 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 11 IS 5 SP 853 OP 862 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2003.817140 DO https://doi.org/10.1109/tvlsi.2003.817140 SF ELIB - SuUB Bremen
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