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A built-in self-repair design for RAMs with 2-D redundancy:

Jin-Fu Li ; Yeh, J.-C. ; Rei-Fu Huang.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  13 (2005)  6 - p. 742-745 , 2005
Link: https://doi.org/10.1109/tvlsi.2005.848824