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Combined time and information redundancy for SEU-tolerance ..:

Ejlali, A. ; Al-Hashimi, B.M. ; Schmitz, M.T...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  14 (2006)  4 - p. 323-335 , 2006
Link: https://doi.org/10.1109/tvlsi.2006.874355