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Modeling, Analysis, and Application of Leakage Induced Damp..:

Jie Gu ; Keane, J. ; Kim, C.H.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  17 (2009)  1 - p. 128-136 , 2009
Link: https://doi.org/10.1109/tvlsi.2008.2001300