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1 Ergebnisse
1
Application Exploration for 3-D Integrated Circuits: TCAM, ..:
Davis, W. Rhett
;
Oh, Eun Chu
;
Sule, Ambarish M.
.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 17 (2009) 4 - p. 496-506 , 2009
Link:
https://doi.org/10.1109/tvlsi.2008.2009352
RT Journal T1
Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studies
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2008.2009352&Exemplar=1&LAN=DE A1 Davis, W. Rhett A1 Oh, Eun Chu A1 Sule, Ambarish M. A1 Franzon, Paul D. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2009 SN 1063-8210 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 17 IS 4 SP 496 OP 506 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2008.2009352 DO https://doi.org/10.1109/tvlsi.2008.2009352 SF ELIB - SuUB Bremen
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