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Application Exploration for 3-D Integrated Circuits: TCAM, ..:

Davis, W. Rhett ; Oh, Eun Chu ; Sule, Ambarish M..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  17 (2009)  4 - p. 496-506 , 2009
Link: https://doi.org/10.1109/tvlsi.2008.2009352