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1 Ergebnisse
1
DFT and Minimum Leakage Pattern Generation for Static Power..:
Kao, Wei-Chung
;
Chuang, Wei-Shun
;
Lin, Hsiu-Ting
..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 18 (2010) 3 - p. 392-400 , 2010
Link:
https://doi.org/10.1109/tvlsi.2008.2011048
RT Journal T1
DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2008.2011048&Exemplar=1&LAN=DE A1 Kao, Wei-Chung A1 Chuang, Wei-Shun A1 Lin, Hsiu-Ting A1 Li, James Chien-Mo A1 Manquinho, Vasco PB Institute of Electrical and Electronics Engineers (IEEE) YR 2010 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 18 IS 3 SP 392 OP 400 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2008.2011048 DO https://doi.org/10.1109/tvlsi.2008.2011048 SF ELIB - SuUB Bremen
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