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A Low Overhead High Test Compression Technique Using Patter..:

Wang, Seongmoon ; Wei, Wenlong ; Wang, Zhanglei
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  18 (2010)  12 - p. 1672-1685 , 2010
Link: https://doi.org/10.1109/tvlsi.2009.2026420