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Period Extension and Randomness Enhancement Using High-Thro..:

Li, Chung-Yi ; Chen, Yuan-Ho ; Chang, Tsin-Yuan..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  20 (2012)  2 - p. 385-389 , 2012
Link: https://doi.org/10.1109/tvlsi.2010.2103332