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1 Ergebnisse
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Testing Methodology of Embedded DRAMs:
Yang, Hao-Yu
;
Chang, Chi-Min
;
Chao, Mango C.-T.
..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 20 (2012) 9 - p. 1715-1728 , 2012
Link:
https://doi.org/10.1109/tvlsi.2011.2161785
RT Journal T1 <Title>Testing Methodology of Embedded DRAMs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2011.2161785&Exemplar=1&LAN=DE A1 Yang, Hao-Yu A1 Chang, Chi-Min A1 Chao, Mango C.-T. A1 Huang, Rei-Fu A1 Lin, Shih-Chin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2012 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 20 IS 9 SP 1715 OP 1728 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2011.2161785 DO https://doi.org/10.1109/tvlsi.2011.2161785 SF ELIB - SuUB Bremen
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