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Analyzing the Impact of Joint Optimization of Cell Size, Re..:
Kim, Nam Sung
;
Draper, Stark C.
;
Zhou, Shi-Ting
...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 20 (2012) 12 - p. 2333-2337 , 2012
Link:
https://doi.org/10.1109/tvlsi.2011.2173220
RT Journal T1 <Title>Analyzing the Impact of Joint Optimization of Cell Size, Redundancy, and ECC on Low-Voltage SRAM Array Total Area</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2011.2173220&Exemplar=1&LAN=DE A1 Kim, Nam Sung A1 Draper, Stark C. A1 Zhou, Shi-Ting A1 Katariya, Sumeet A1 Ghasemi, Hamid Reza A1 Park, Taejoon PB Institute of Electrical and Electronics Engineers (IEEE) YR 2012 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 20 IS 12 SP 2333 OP 2337 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2011.2173220 DO https://doi.org/10.1109/tvlsi.2011.2173220 SF ELIB - SuUB Bremen
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