I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Design of a Practical Nanometer-Scale Redundant Via-Aware S..:

Kan, Tsang-Chi ; Yang, Shih-Hsien ; Chang, Ting-Feng.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  21 (2013)  1 - p. 142-147 , 2013
Link: https://doi.org/10.1109/tvlsi.2011.2176968