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1 Ergebnisse
1
Improved Trace Buffer Observation via Selective Data Captur..:
Yang, Joon-Sung
;
Touba, Nur A.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 21 (2013) 2 - p. 320-328 , 2013
Link:
https://doi.org/10.1109/tvlsi.2012.2183399
RT Journal T1
Improved Trace Buffer Observation via Selective Data Capture Using 2-D Compaction for Post-Silicon Debug
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2012.2183399&Exemplar=1&LAN=DE A1 Yang, Joon-Sung A1 Touba, Nur A. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2013 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 21 IS 2 SP 320 OP 328 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2012.2183399 DO https://doi.org/10.1109/tvlsi.2012.2183399 SF ELIB - SuUB Bremen
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