I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
AC-Plus Scan Methodology for Small Delay Testing and Charac..:
Li, Tsung-Yeh
;
Huang, Shi-Yu
;
Hsu, Hsuan-Jung
...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 21 (2013) 2 - p. 329-341 , 2013
Link:
https://doi.org/10.1109/tvlsi.2012.2187223
RT Journal T1
AC-Plus Scan Methodology for Small Delay Testing and Characterization
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2012.2187223&Exemplar=1&LAN=DE A1 Li, Tsung-Yeh A1 Huang, Shi-Yu A1 Hsu, Hsuan-Jung A1 Tzeng, Chao-Wen A1 Huang, Chih-Tsun A1 Liou, Jing-Jia A1 Ma, Hsi-Pin A1 Huang, Po-Chiun A1 Bor, Jenn-Chyou A1 Tien, Ching-Cheng A1 Wang, Chih-Hu A1 Wu, Cheng-Wen PB Institute of Electrical and Electronics Engineers (IEEE) YR 2013 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 21 IS 2 SP 329 OP 341 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2012.2187223 DO https://doi.org/10.1109/tvlsi.2012.2187223 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)