I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

AC-Plus Scan Methodology for Small Delay Testing and Charac..:

Li, Tsung-Yeh ; Huang, Shi-Yu ; Hsu, Hsuan-Jung...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  21 (2013)  2 - p. 329-341 , 2013
Link: https://doi.org/10.1109/tvlsi.2012.2187223