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In-Situ Method for TSV Delay Testing and Characterization U..:

You, Jhih-Wei ; Huang, Shi-Yu ; Lin, Yu-Hsiang...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  21 (2013)  3 - p. 443-453 , 2013
Link: https://doi.org/10.1109/tvlsi.2012.2187543