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1 Ergebnisse
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Fast Transistor Threshold Voltage Measurement Method for Hi..:
Tseng-Chin Luo
;
Chao, Mango C-T
;
Huan-Chi Tseng
...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22 (2014) 5 - p. 1138-1149 , 2014
Link:
https://doi.org/10.1109/tvlsi.2013.2265299
RT Journal T1 <Title>Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2013.2265299&Exemplar=1&LAN=DE A1 Tseng-Chin Luo A1 Chao, Mango C-T A1 Huan-Chi Tseng A1 Goto, Masaharu A1 Fisher, Philip A. A1 Yuan-Yao Chang A1 Chi-Min Chang A1 Takao, Takayuki A1 Iwasaki, Katsuhito A1 Cheng Mao Lee PB Institute of Electrical and Electronics Engineers (IEEE) YR 2014 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 22 IS 5 SP 1138 OP 1149 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2013.2265299 DO https://doi.org/10.1109/tvlsi.2013.2265299 SF ELIB - SuUB Bremen
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