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1 Ergebnisse
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Reducing Cost of Yield Enhancement in 3-D Stacked Memories ..:
Rab, Muhammad Tauseef
;
Bawa, Asad Amin
;
Touba, Nur A.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22 (2014) 9 - p. 2017-2024 , 2014
Link:
https://doi.org/10.1109/tvlsi.2013.2280593
RT Journal T1
Reducing Cost of Yield Enhancement in 3-D Stacked Memories Via Asymmetric Layer Repair Capability
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2013.2280593&Exemplar=1&LAN=DE A1 Rab, Muhammad Tauseef A1 Bawa, Asad Amin A1 Touba, Nur A. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2014 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 22 IS 9 SP 2017 OP 2024 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2013.2280593 DO https://doi.org/10.1109/tvlsi.2013.2280593 SF ELIB - SuUB Bremen
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