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Reducing Cost of Yield Enhancement in 3-D Stacked Memories ..:

Rab, Muhammad Tauseef ; Bawa, Asad Amin ; Touba, Nur A.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  22 (2014)  9 - p. 2017-2024 , 2014
Link: https://doi.org/10.1109/tvlsi.2013.2280593