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Utilizing Circuit Structure for Scan Chain Diagnosis:

Lo, Wei-Hen ; Hsieh, Ang-Chih ; Lan, Chien-Ming..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  22 (2014)  12 - p. 2766-2778 , 2014
Link: https://doi.org/10.1109/tvlsi.2013.2294712