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Scan Chain Masking for Diagnosis of Multiple Chain Failures..:

Kundu, Subhadip ; Chattopadhyay, Santanu ; Sengupta, Indranil.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  23 (2015)  7 - p. 1185-1195 , 2015
Link: https://doi.org/10.1109/tvlsi.2014.2333691